Description
The X-PIPS detector array is a spectroscopy sub-system that is sensitive to X-rays and low-energy gamma rays. It comprises of seven Silicon Drift Detectors (SDD) with a low noise CMOS reset type preamplifier, a HV bias supply and a cryogenic cooler. The detector elements and CMOS preamplifiers are cooled and temperature regulated, ensuring stable operation in changing environmental conditions. The Beryllium entrance window is 1 mil (25 μm) thick which allows for measurement of X-rays as low as 1 keV.
The CMOS preamplifiers have a fast reset mechanism which reduces dead time and allows the detector to perform well at very high count rate performance.
The high performance SDD combined with a CMOS preamplifier provides a very fast, low noise response, which results in extremely good energy resolution with fast peaking times. The signal rise time is well below 50 ns which makes for excellent energy resolution at high count rates.
The energy resolution is guaranteed within an ambient temperature range of +10 °C to + 30 °C with the default factory settings.
The detector is cooled by a 1.5 W pulse-tube cooler. This technology allows low operating temperature which leads to faster signal rise time and better resolution at higher count rates. Other advantages of this cryo-cooler are the ease of maintenance, high reliability, long lifetime (>10 years), low power consumption (<50 W) and very low vibration levels. The pulse-tube cooler operates with a pressure wave instead of a piston, virtually eliminating wear and vibrations. Although the compressor already exhibits very low vibration levels, all efforts are done to reduce these even more. Apart from shock mounts to isolate the compressor from the rest of the cooler and the detector housing, the system is equipped with an active vibration reduction system.
Performance
- Total maximum output count rate: >15 Mcps
- Guaranteed resolution: <135 eV FWHM (typ. below 125 eV)
- Energy range: 1 to 30 keV
- Collimated active area: 7 x 80 mm2
- Detector thickness: 0.5 mm
Applications
- X-ray Absorption Spectroscopy (EXAFS, XANES, …)
- X-ray Fluorescence
- X-ray Diffraction
- Mössbauer Spectroscopy
- Densitometry